RAVEN

Rapid Analysis of Various Emerging Nanoelectronics
RAVEN

Intelligence Value

The RAVEN program seeks to develop technology that will ensure the manufacturing quality of integrated circuits used in advanced computing and communications technologies. The RAVEN program aims to develop a prototype analysis tool for acquiring images from all layers in a 1 cm2 area of a 14 nm integrated circuit, within 25 days.

Summary

The semiconductor industry continues to advance both the scaling of integrated circuits and the integration of multiple die into a single package. The sheer magnitude of these technology nodes requires high-speed and high-resolution image acquisition for process verification and failure analysis – a process that provides information necessary for technology advancement and for corrective action to improve quality and reliability.

The RAVEN program launched in 2016 and its objective is to develop prototype tools for acquiring images from all layers in a 1 cm2 area of a 10 nm integrated circuit within 25 days. RAVEN encompasses four major areas for the tool development that will define success: (1) rapid acquisition of images from a bare die; (2) real-time image analysis with in-situ feedback to minimize or eliminate reworks due to image anomalies; (3) innovative algorithms for reconstructing the images of individual device layers and the overall device; and (4) computational resources for acquiring, moving, storing and analyzing petabyte size data files.

Proposers' Day Briefings

Related Publications

To access RAVEN program-related publications, please visit Google Scholar.


Contact Information

Program Manager

Dr. William Harrod

Research Area(s)

Machine learning, Microelectronics, Deep neural networks , Integrated circuit, Sample preparation, Imaging, Reconstruction, Failure analysis, Counterfeit detection, Scanning electron microscope, Synchrotron, Multibeam SEM

Related Program(s)

CAT

Broad Agency Announcement (BAA)

Link(s) to BAA

IARPA-BAA-15-12

Solicitation Status

CLOSED

Proposers' Day Date

August 25, 2015

BAA Release Date

January 12, 2016

Proposal Due Date

Monday, 14 March 2016

Program Summary

Testing and Evaluation Partners

  • Argonne National Laboratory
  • Los Alamos National Laboratory 
  • National Institute of Standards and Technology 
  • Sandia National Laboratories 
  • SLAC National Accelerator Laboratory

Prime Performers

  • Varioscale Inc.
  • Massachusetts Institute of Technology