Rapid Analysis of Various Emerging Nanoelectronics


The RAVEN program aims to develop a prototype analysis tool for acquiring images from all layers in a 1 cm2 area of a 14 nm integrated circuit, within 25 days. Program goals include:

1) Minimum 10 nm spatial resolution.
2) Nondestructive image acquisition using a single test sample; or
3) Destructive image acquisition using at most 5 test samples.
4) Twenty-five (25) days total to acquire the images from the sample(s).
5) Real-time checking during the acquisition process to eliminate the need for re-scans.

RAVEN is anticipated to be a three-phase program. The resolution and acquisition speed performance will be initially demonstrated in a laboratory test bench. The program outcome is expected to be a fully automated prototype tool capable of rapid image acquisition from an individual chip. Given the acquisition speed requirements, computing and graphical analysis capabilities are an important aspect of the tool development.

Proposers' Day Briefings

Related Publications

To access RAVEN program-related publications, please visit Google Scholar.

Contact Information

Program Manager

Dr. William Harrod

Contracting Office Address

Office of the Director of National Intelligence

Intelligence Advanced Research Projects Activity

Washington, DC 20511

Research Area(s)

Hardware assurance, Microelectronics, Nanoscale imaging, Nondestructive analysis

Related Program(s)


Broad Agency Announcement (BAA)

Link(s) to BAA


Solicitation Status


Proposers' Day Date

August 25, 2015

BAA Release Date

January 12, 2016

BAA Question Period

January 12, 2016 — February 16, 2016

Proposal Due Date

Monday, 14 March 2016